Invited speakers

Plenary speakers

David Awschalom
University of Chicago, USA
Beyond electronics: abandoning perfection for quantum technologies
Didier Blavette
University of Rouen, France
Atomic-scale investigation of defects in semiconductors using atom probe tomography
Colin Humphreys
University of Cambridge, UK
Why are InGaN/GaN LEDs so bright when the dislocation density is so high? The importance of the atomic structure of the InGaN quantum wells
Chris Van de Walle
University of California, Santa Barbara, USA
Impact of defects on efficiency of solid-state light emitters

Special plenary session on Coupling and Comparison of Computational and Experimental Approaches to Defects in Semiconductors speakers

Matt McCluskey
Washington State University, USA
Defects in ZnO and SrTiO3
Sokrates Pantelides
Vanderbildt University, USA
Connecting theory to experiments – Defects in semiconductor electronic devices
Alfredo Pasquarello
Ecole Polytechnique Federale de Lausanne, Switzerland
Accuracy of defect levels through advanced electronic-structure methods
Bengt Svensson
University of Oslo, Norway
Abundant point defects in Si, SiC and ZnO; comparison between experiment and theory

Invited speakers in the parallel sessions

Martin Albrecht
Leibniz Institute of Crystal Growth, Germany
Structural and optical properties of dislocations in III-nitrides
Audrius Alkauskas
Center for Physical Sciences and Technology, Lithuania
First principles theory of radiative and nonradiative carrier capture processes at point defects
Pavel Baranov
Ioffe Institute, Russia
Electron paramagnetic resonance of defects in wide-band gap semiconductors and related nanostructures
Jose Coutinho
University of Aveiro, Portugal
Nanodopants for solid arrays of semiconductor nanocrystals
Philip Dawson
University of Manchester, UK
Effects of carrier localisation in InGaN/GaN quantum well structures
Kai-Mei Fu
University of Washington, USA
Hybrid GaP-diamond photonic devices for scalable on-chip entanglement of defects in diamond
Adam Gali
Wigner Center, Hungary
Defects in diamond and silicon carbide for quantum computing and sensing
Junko Ishi-Hayase
Keio University, Japan
Control of position and orientation of nitrogen-vacancy centers in CVD-grown diamond thin film
Anderson Janotti
University of California, Santa Barbara, USA
The role of vacancies and polarons in SrTiO3
Arkady Krasheninnikov
Aalto University, Finland
Defects in two-dimensional materials: their production under irradiation, evolution and properties
Norikazu Mizuochi
Osaka University, Japan
Control of qubits and orientation of NV center in diamond
Rachel Oliver
University of Cambridge, UK
Multi-microscopy analysis of defects in GaN-based microdisk lasers
Clas Persson
University of Oslo, Norway
Native defects in Cu(In,Ga)Se2 and Cu2ZnSn(S,Se)4
Patrick Rinke
Aalto University, Finland
Space-charge transfer and charged defects at surfaces
David Scanlon
University College London, UK
Defect and band engineering in Sn-based oxides
Alex Shluger
University College London, UK
Identifying defects at interfaces for microelectronics
Wolfgang Skorupa
Helmoltz Zentrum Dresden-Rossendorf, Germany
Subsecond thermal processing for nanostructured semiconductors
Nguyen T. Son
Linköping University, Sweden
Identification of shallow donor in natural MoS2
Andre Stesmans
KU Leuven, Belgium
Intrinsic point defects at high-mobility semiconductor/insulator interfaces probed by ESR: Ge and GaAs
Timothy Veal
University of Liverpool, UK
Optical properties and defects in GaSbBi and GaNSb alloys
Kazumi Wada
University of Tokyo, Japan
Recent progress in Si microphotonics – defects and photonic device performances
Kin Man Yu
City University of Hong Kong, China
Defects and properties of cadmium oxide based transparent conductors for full spectrum photovoltaics
Andriy Zakutayev
National Renewable Energy Laboratory, USA
Defects in “earth abundant” semiconductors for PV: experiment and theory
Shengbai Zhang
Rensselaer Polytechnic Institute, USA
Coupling molecular dynamics with time-dependent density functional theory to probe excited carrier dynamics